Test & measurement instruments

Plating Thickness Gauge LS225 + F500 - 0-500 µm

Linshang  |  SKU: THK-K9S5-01
$770.76 USD
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Description

The Linshang LS225 + F500 plating thickness gauge measures non-magnetic coatings on steel, iron and other ferromagnetic metal substrates. The kit pairs one LS225 display unit with one F500 magnetic-induction probe, covering 0–500 µm for thin plating and paint inspection.

Inspect coatings on small metal parts

Use the F500 probe for compatible zinc, copper, chromium or paint coatings on ferrous parts such as screws, bolts and formed hardware. The minimum measuring area is 7 mm in diameter. Check the substrate thickness and curvature limits before choosing a measurement location; the probe cannot measure every coating and substrate combination.

The separate cable-connected probe lets you position the tip while keeping the screen in view. Hold the probe perpendicular to the workpiece and lift it clear between single readings. A matching test fixture is optional and is not included in this host-and-probe kit.

LS225 multi-point calibration with the F500 probe and reference films
LS225 multi-point calibration with the F500 probe and reference films

Calibration and recent-reading statistics

Perform zero adjustment on a suitable uncoated reference before calibration. One- to five-point calibration is available; the accuracy specification below applies after five-point calibration. Prepare calibration films in increasing thickness and keep the probe stable during each reading.

The display calculates the maximum, minimum, average and standard deviation of the latest nine valid readings. Up to nine recent records are retained after power-off. This supports a short sequence of checks on a workpiece without manually calculating the basic statistics.

LS225 recent-reading statistics shown during F500 measurement
LS225 recent-reading statistics shown during F500 measurement

F500 measurement specifications

Principle and substrate Magnetic induction; ferromagnetic metal
Range 0–500 µm
Resolution 0.1 µm at 0–99.9 µm; 1 µm at 100–500 µm
Accuracy after five-point calibration ≤±(2%H + 0.3 µm)
Repeatability with matching test fixture ≤±(0.8%H + 0.1 µm)
Reference thickness H is the standard/reference thickness
Measuring interval 1.5 s in single mode; 0.4 s in continuous mode
Minimum measuring area 7 mm diameter
Minimum substrate thickness 0.1 mm
Minimum curvature radius Convex: 1.5 mm; concave: 10 mm
Probe dimensions 110 x 15 mm, excluding connecting cable
Units µm / mil
Display 240 x 160 dot-matrix LCD
Power Four 1.5 V AAA alkaline batteries
Host dimensions 148 x 76 x 26 mm
Instrument weight 194 g host including batteries; 81 g probe; 275 g combined
Operating environment 0–50°C; 0–85% RH, non-condensing

Choose the appropriate measuring setup

Use single measurement mode for precision checks. For repeatability testing under the stated specification, use the matching optional fixture to control probe placement. The repeatability formula is a conditional specification, rather than a fixed 0.1 µm accuracy claim. The kit includes one host and one F500 probe; other probes and the test fixture are separate options.